Abstract

Most applications of a ferroelectric-based electro-optic (EO) beam deflector have been limited by the high applied voltage. In this Letter, we report a dramatically increased EO beam deflection in relaxor ferroelectric potassium tantalate niobate (KTN) crystals by using the electric-field-enhanced permittivity. Due to the existence of the electric-field-induced phase transition in relaxor ferroelectric materials, the dielectric permittivity can be substantially increased by the applied electric field at a certain temperature. Both the theoretical study and the experimental verifications on the enhanced beam deflection and EO effect in the case with the electric-field-induced high permittivity were conducted. The experimental results confirmed that there was a three-fold increase in the deflection angle, which represented a dramatic increase in the deflection angle. By offering a wider deflection range and a lower driving voltage, such a largely enhanced beam deflection is of great benefit to the KTN deflector.

© 2019 Optical Society of America

Full Article  |  PDF Article

Corrections

22 November 2019: A typographical correction was made to the funding section.


OSA Recommended Articles
Kovacs effect enhanced broadband large field of view electro-optic modulators in nanodisordered KTN crystals

Yun-Ching Chang, Chao Wang, Shizhuo Yin, Robert C. Hoffman, and Andrew G. Mott
Opt. Express 21(15) 17760-17768 (2013)

Linear Electro-Optic Effect in Ferroelectric KTN

John A. van Raalte
J. Opt. Soc. Am. 57(5) 671-674 (1967)

High speed non-mechanical two-dimensional KTN beam deflector enabled by space charge and temperature gradient deflection

Ju-Hung Chao, Wenbin Zhu, Chang-Jiang Chen, Adrian L. Campbell, Michael G. Henry, Shizhuo Yin, and Robert C. Hoffman
Opt. Express 25(13) 15481-15492 (2017)

References

  • View by:
  • |
  • |
  • |

  1. G. H. Haertling, J. Am. Ceram. Soc. 82, 797 (1999).
    [Crossref]
  2. S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
    [Crossref]
  3. J.-H. Chao, W. Zhu, C.-J. Chen, A. L. Campbell, M. G. Henry, S. Yin, and R. C. Hoffman, Opt. Express 25, 15481 (2017).
    [Crossref]
  4. Y. Wang, S. Zhou, D. He, Y. Hu, H. Chen, W. Liang, J. Yu, H. Guan, Y. Luo, J. Zhang, Z. Chen, and H. Lu, Opt. Lett. 41, 4739 (2016).
    [Crossref]
  5. X. Yu, H. Wang, and X. Rong, Opt. Mater. 46, 429 (2015).
    [Crossref]
  6. W. Zhu, J.-H. Chao, C.-J. Chen, S. Yin, and R. C. Hoffman, Sci. Rep. 6, 33143 (2016).
    [Crossref]
  7. F. Vieira, F. Cruz, D. Plusquellic, and S. Diddams, Opt. Express 24, 30100 (2016).
    [Crossref]
  8. Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
    [Crossref]
  9. S. Kawamura, T. Imai, J. Miyazu, T. Sakamoto, and J. Kobayashi, Appl. Opt. 54, 4197 (2015).
    [Crossref]
  10. J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
    [Crossref]
  11. G. Xu, J. Wen, C. Stock, and P. M. Gehring, Nat. Mater. 7, 562 (2008).
    [Crossref]
  12. S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
    [Crossref]
  13. J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
    [Crossref]
  14. C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
    [Crossref]
  15. T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
    [Crossref]
  16. K. Uchino, L. E. Cross, R. E. Newnham, and S. Nomura, J. Appl. Phys. 52, 1455 (1981).
    [Crossref]
  17. J. E. Geusic, S. K. Kurtz, L. G. Van Uitert, and S. H. Wemple, Appl. Phys. Lett. 4, 141 (1964).
    [Crossref]

2019 (1)

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

2017 (1)

2016 (3)

2015 (3)

X. Yu, H. Wang, and X. Rong, Opt. Mater. 46, 429 (2015).
[Crossref]

S. Kawamura, T. Imai, J. Miyazu, T. Sakamoto, and J. Kobayashi, Appl. Opt. 54, 4197 (2015).
[Crossref]

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

2014 (1)

T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
[Crossref]

2013 (1)

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

2011 (1)

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

2008 (2)

G. Xu, J. Wen, C. Stock, and P. M. Gehring, Nat. Mater. 7, 562 (2008).
[Crossref]

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

2004 (1)

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

1999 (1)

G. H. Haertling, J. Am. Ceram. Soc. 82, 797 (1999).
[Crossref]

1981 (1)

K. Uchino, L. E. Cross, R. E. Newnham, and S. Nomura, J. Appl. Phys. 52, 1455 (1981).
[Crossref]

1964 (1)

J. E. Geusic, S. K. Kurtz, L. G. Van Uitert, and S. H. Wemple, Appl. Phys. Lett. 4, 141 (1964).
[Crossref]

Anthoniappen, J.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Campbell, A. L.

Chai, C.-K.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Chao, J.-H.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

J.-H. Chao, W. Zhu, C.-J. Chen, A. L. Campbell, M. G. Henry, S. Yin, and R. C. Hoffman, Opt. Express 25, 15481 (2017).
[Crossref]

W. Zhu, J.-H. Chao, C.-J. Chen, S. Yin, and R. C. Hoffman, Sci. Rep. 6, 33143 (2016).
[Crossref]

Chen, C.-J.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

J.-H. Chao, W. Zhu, C.-J. Chen, A. L. Campbell, M. G. Henry, S. Yin, and R. C. Hoffman, Opt. Express 25, 15481 (2017).
[Crossref]

W. Zhu, J.-H. Chao, C.-J. Chen, S. Yin, and R. C. Hoffman, Sci. Rep. 6, 33143 (2016).
[Crossref]

Chen, C.-S.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Chen, H.

Chen, P.-Y.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Chen, Z.

Chiu, S.-J.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Cross, L. E.

K. Uchino, L. E. Cross, R. E. Newnham, and S. Nomura, J. Appl. Phys. 52, 1455 (1981).
[Crossref]

Cruz, F.

Diddams, S.

Dubinskii, M.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

Enbutsu, K.

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Fujiura, K.

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Fushimi, H.

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Gehring, P. M.

G. Xu, J. Wen, C. Stock, and P. M. Gehring, Nat. Mater. 7, 562 (2008).
[Crossref]

Geusic, J. E.

J. E. Geusic, S. K. Kurtz, L. G. Van Uitert, and S. H. Wemple, Appl. Phys. Lett. 4, 141 (1964).
[Crossref]

Guan, H.

Haertling, G. H.

G. H. Haertling, J. Am. Ceram. Soc. 82, 797 (1999).
[Crossref]

He, D.

Henry, M. G.

Hoffman, R. C.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

J.-H. Chao, W. Zhu, C.-J. Chen, A. L. Campbell, M. G. Henry, S. Yin, and R. C. Hoffman, Opt. Express 25, 15481 (2017).
[Crossref]

W. Zhu, J.-H. Chao, C.-J. Chen, S. Yin, and R. C. Hoffman, Sci. Rep. 6, 33143 (2016).
[Crossref]

Hu, Y.

Ike, Y.

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Imai, T.

S. Kawamura, T. Imai, J. Miyazu, T. Sakamoto, and J. Kobayashi, Appl. Opt. 54, 4197 (2015).
[Crossref]

T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
[Crossref]

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Kano, J.

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Kato, K.

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

Kawamura, S.

Kobayashi, J.

S. Kawamura, T. Imai, J. Miyazu, T. Sakamoto, and J. Kobayashi, Appl. Opt. 54, 4197 (2015).
[Crossref]

T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
[Crossref]

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

Kojima, S.

T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
[Crossref]

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Kurihara, T.

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Kurtz, S. K.

J. E. Geusic, S. K. Kurtz, L. G. Van Uitert, and S. H. Wemple, Appl. Phys. Lett. 4, 141 (1964).
[Crossref]

Lee, H.-Y.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Lee, Y. G.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

Liang, W.

Liu, R.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

Lu, H.

Luo, Y.

Manabe, K.

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Matsuura, T.

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Miyazu, J.

S. Kawamura, T. Imai, J. Miyazu, T. Sakamoto, and J. Kobayashi, Appl. Opt. 54, 4197 (2015).
[Crossref]

T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
[Crossref]

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

Newnham, R. E.

K. Uchino, L. E. Cross, R. E. Newnham, and S. Nomura, J. Appl. Phys. 52, 1455 (1981).
[Crossref]

Nomura, S.

K. Uchino, L. E. Cross, R. E. Newnham, and S. Nomura, J. Appl. Phys. 52, 1455 (1981).
[Crossref]

Ohmi, M.

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

Okabe, Y.

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

Plusquellic, D.

Rong, X.

X. Yu, H. Wang, and X. Rong, Opt. Mater. 46, 429 (2015).
[Crossref]

Sakamoto, T.

S. Kawamura, T. Imai, J. Miyazu, T. Sakamoto, and J. Kobayashi, Appl. Opt. 54, 4197 (2015).
[Crossref]

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

Sasaki, Y.

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

Sasaura, M.

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Sekiya, T.

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Shang, A.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

Shimojo, Y.

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Shimokozono, M.

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Stock, C.

G. Xu, J. Wen, C. Stock, and P. M. Gehring, Nat. Mater. 7, 562 (2008).
[Crossref]

Tate, A.

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Ting, Y.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Toyoda, S.

T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
[Crossref]

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Tsukada, S.

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Tu, C. S.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Uchino, K.

K. Uchino, L. E. Cross, R. E. Newnham, and S. Nomura, J. Appl. Phys. 52, 1455 (1981).
[Crossref]

Ueno, M.

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

Van Uitert, L. G.

J. E. Geusic, S. K. Kurtz, L. G. Van Uitert, and S. H. Wemple, Appl. Phys. Lett. 4, 141 (1964).
[Crossref]

Vieira, F.

Wang, H.

X. Yu, H. Wang, and X. Rong, Opt. Mater. 46, 429 (2015).
[Crossref]

Wang, R.

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Wang, S.-F.

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

Wang, Y.

Wemple, S. H.

J. E. Geusic, S. K. Kurtz, L. G. Van Uitert, and S. H. Wemple, Appl. Phys. Lett. 4, 141 (1964).
[Crossref]

Wen, J.

G. Xu, J. Wen, C. Stock, and P. M. Gehring, Nat. Mater. 7, 562 (2008).
[Crossref]

Xu, G.

G. Xu, J. Wen, C. Stock, and P. M. Gehring, Nat. Mater. 7, 562 (2008).
[Crossref]

Yagi, S.

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

Yin, S.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

J.-H. Chao, W. Zhu, C.-J. Chen, A. L. Campbell, M. G. Henry, S. Yin, and R. C. Hoffman, Opt. Express 25, 15481 (2017).
[Crossref]

W. Zhu, J.-H. Chao, C.-J. Chen, S. Yin, and R. C. Hoffman, Sci. Rep. 6, 33143 (2016).
[Crossref]

Yu, J.

Yu, X.

X. Yu, H. Wang, and X. Rong, Opt. Mater. 46, 429 (2015).
[Crossref]

Zhang, J.

Zhou, S.

Zhu, W.

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

J.-H. Chao, W. Zhu, C.-J. Chen, A. L. Campbell, M. G. Henry, S. Yin, and R. C. Hoffman, Opt. Express 25, 15481 (2017).
[Crossref]

W. Zhu, J.-H. Chao, C.-J. Chen, S. Yin, and R. C. Hoffman, Sci. Rep. 6, 33143 (2016).
[Crossref]

Appl. Opt. (1)

Appl. Phys. Express (2)

J. Miyazu, T. Imai, S. Toyoda, M. Sasaura, S. Yagi, K. Kato, Y. Sasaki, and K. Fujiura, Appl. Phys. Express 4, 111501 (2011).
[Crossref]

T. Imai, S. Toyoda, J. Miyazu, J. Kobayashi, and S. Kojima, Appl. Phys. Express 7, 071501 (2014).
[Crossref]

Appl. Phys. Lett. (1)

J. E. Geusic, S. K. Kurtz, L. G. Van Uitert, and S. H. Wemple, Appl. Phys. Lett. 4, 141 (1964).
[Crossref]

J. Alloys Compd. (2)

J. Anthoniappen, C. S. Tu, P.-Y. Chen, C.-S. Chen, S.-J. Chiu, H.-Y. Lee, Y. Ting, S.-F. Wang, and C.-K. Chai, J. Alloys Compd. 618, 120 (2015).
[Crossref]

C.-J. Chen, W. Zhu, J.-H. Chao, A. Shang, Y. G. Lee, R. Liu, S. Yin, M. Dubinskii, and R. C. Hoffman, J. Alloys Compd. 804, 35 (2019).
[Crossref]

J. Am. Ceram. Soc. (1)

G. H. Haertling, J. Am. Ceram. Soc. 82, 797 (1999).
[Crossref]

J. Appl. Phys. (1)

K. Uchino, L. E. Cross, R. E. Newnham, and S. Nomura, J. Appl. Phys. 52, 1455 (1981).
[Crossref]

J. Phys. Soc. Jpn. (1)

S. Tsukada, Y. Ike, J. Kano, T. Sekiya, Y. Shimojo, R. Wang, and S. Kojima, J. Phys. Soc. Jpn. 77, 033707 (2008).
[Crossref]

Jpn. J. Appl. Phys. (1)

S. Toyoda, K. Fujiura, M. Sasaura, K. Enbutsu, A. Tate, M. Shimokozono, H. Fushimi, T. Imai, K. Manabe, T. Matsuura, and T. Kurihara, Jpn. J. Appl. Phys. 43, 5862 (2004).
[Crossref]

Nat. Mater. (1)

G. Xu, J. Wen, C. Stock, and P. M. Gehring, Nat. Mater. 7, 562 (2008).
[Crossref]

Opt. Express (2)

Opt. Lett. (1)

Opt. Mater. (1)

X. Yu, H. Wang, and X. Rong, Opt. Mater. 46, 429 (2015).
[Crossref]

Opt. Photonics J. (1)

Y. Okabe, Y. Sasaki, M. Ueno, T. Sakamoto, S. Toyoda, J. Kobayashi, and M. Ohmi, Opt. Photonics J. 03, 190 (2013).
[Crossref]

Sci. Rep. (1)

W. Zhu, J.-H. Chao, C.-J. Chen, S. Yin, and R. C. Hoffman, Sci. Rep. 6, 33143 (2016).
[Crossref]

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (5)

Fig. 1.
Fig. 1. Illustration of the temperature-dependent permittivity of a KTN crystal with and without the electric-field-induced phase transition.
Fig. 2.
Fig. 2. Configuration of a KTN-based optical deflector.
Fig. 3.
Fig. 3. Measured temperature-dependent relative permittivities of the KTN crystal (Sample A) with and without an applied electric field.
Fig. 4.
Fig. 4. Measured relative permittivity of Sample A as a function of the applied electric field at 25°C and 32°C, respectively. The linear functions that were extracted from Stage 1 and Stage 2 are ε r ( E ) = 0.028 · E + 16200 and ε r ( E ) = 0.415 · E 54221 , respectively.
Fig. 5.
Fig. 5. Measured deflection angle of Sample B as a function of the applied voltage at 25°C and 32°C, respectively.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

Δ n ( x ) = 1 2 n 0 3 s 11 E 2 ( x ) ,
s 11 = g 11 ε 0 2 ( ε r 1 ) 2 g 11 ε 0 2 ε r 2 for ε r 1 ,
θ ( x ) = L d Δ n ( x ) d x = L n 0 3 g 11 ε 0 2 ε r 2 E ( x ) d E ( x ) d x ,
θ ( x ) = L n 0 3 ε 0 2 g 11 ε r ( E ( x ) ) d ε r ( E ( x ) ) d x E 2 ( x ) L n 0 3 ε 0 2 g 11 ε r 2 ( E ( x ) ) E ( x ) d E ( x ) d x .

Metrics