Abstract

We present a new phase-sweep method for characterizing laser-induced complex dielectric gratings. This characterization requires four parameters: the amplitudes and the spatial phases of both the refractive-index and the absorption components. We apply this phase-sweep method to study a complex polarizability grating in a nominally undoped cubic photorefractive Bi12TiO20 crystal. We determine the polarizability difference αfe between a full and an empty photoexcitable deep trap at 633 nm in Bi12TiO20 to be (2.5 − 8.3i ± 1.0 ± 3.3i) × 10−40 F m2 in SI units or (2.3 − 7.5i ± 0.9 ± 3.0i) × 10−24 cm3 in Gaussian units.

© 1994 Optical Society of America

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