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OSA Publishing

The Optical Society (OSA) publishes high-quality, peer-reviewed articles in its portfolio of journals, which serve the full breadth of the optics and photonics community.

Optics Express is the all-electronic, open-access journal for optics providing rapid publication for peer-reviewed articles that emphasize scientific and technology innovations in all aspects of optics and photonics.

Additionally, Optics Express publishes papers dedicated to new developments in the science and engineering of light and their impact on sustainable energy, the environment, and green technologies in its dedicated section, Energy and Environmental Optics Express. These papers are published online in each issue as they are ready.

For details about the scope of Optics Express with regards to digital image processing, see the editorial published in April 2014.

Optics Express considers original research articles, special issue contributions, invited reviews and comments on published articles.

Submission Information

Is my paper appropriate for Optics Express? Read about all OSA journals here.

Please see the Author Resource Center for instructions to prepare and submit a manuscript.

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Key Journal Metrics

Impact Factor: 3.561*
Eigenfactor Score: 0.17335 (ranked 1st out of 95 journals)*
Total Citations: 115,635 (ranked 2nd out of 95 journals)*
Google Scholar h5-index: 99 (ranked 2nd among Optics & Photonics journals)
Median Time to Publication: 70 days

*According to Optics category rankings in the 2018 Journal Citation Reports® (Clarivate Analytics, 2019)
July 2019 Google Scholar Optics & Photonics Top Publications.

For more information on Journal metrics, click here.

Editorial Board


Editor-in-Chief
James Leger,
University of Minnesota, USA

Senior Deputy Editor
Chris Dainty, National University of Ireland (Ireland) and University College London, UK
Deputy Editors
Nicolas Bonod, CNRS, Aix-Marseille Université, France
Glenn Boreman, University of North Carolina at Charlotte, USA
Svetlana Boriskina, Massachusetts Institute of Technology, USA (Energy and Environmental Optics Express)
John Girkin, University of Durham, UK
Magnus Karlsson, Chalmers University of Technology, Sweden
Xiang Liu, Futurewei Technologies, USA
Alexander I. Lvovsky, University of Calgary, Canada
Thomas E. Murphy, University of Maryland at College Park, USA
Marija Strojnik, Optical Research Center, Mexico
Associate Editors

Ayman Alfalou, ISEN-Brest, France
Christos Argyropoulos, University of Nebraska Lincoln, USA
Paul Barclay, University of Calgary, Canada
Andreas Behrendt, University of Hohenheim, Germany
Philippe Ben-Abdallah, Institut d'Optique Graduate School, France
Peter Bermel, Purdue University, USA
Benedikt Bläsi, Fraunhofer ISE, Germany
Pablo Bianucci, Concordia University, Canada
Patrick Bouchon, CNRS-ONERA, France
Gerard Bouwmans, Lille I University, France
Christophe Caucheteur, Universite de Mons, Belgium
Guoqing (Noah) Chang, Institute of Physics, Chinese Academy of Sciences, China
Maria Chekhova, Max Planck Institute for the Science of Light, Germany
Yanne Chembo, University of Maryland, USA
Xi (Vivian) Chen, Nokia Bell Labs, USA
Yung-Fu Chen, National Chiao Tung University, Taiwan
Myunghwan (Mark) Choi, Sungkyunkwan University, S. Korea
Andy Chong, University of Dayton, USA
Ian Coddington, National Institute of Standards & Technology, USA
Hilmi Volkan Demir, Nanyang Technological University LUMINOUS!, Singapore, and Bilkent University UNAM, Turkey
Thibault Derrien, Institute of Physics (FZU), Academy of Science of the Czech Republic, Czech Republic
Yajie Dong, University of Central Florida, USA
David Doxaran, Lab d'Océanographie de Villefranche—LOV, France
Yannick Dumeige, Université de Rennes I, France
Jonathan Ellis, University of Arizona, USA
Andrew Forbes, University of the Witwatersrand, South Africa
Matthew Foreman, Imperial College London, UK
Amy Foster, Johns Hopkins University, USA
Sonja Franke-Arnold, University of Glasgow, UK
Jesse Frantz, US Naval Research Laboratory, USA
Gerald Fraser, National Institute of Standards and Technology (NIST), USA
Ulrike Fuchs, asphericon Gmbh, Germany
Takao Fuji, Institute for Molecular Science, Japan
Takeshi Fujisawa, Hokkaido University, Japan
Vincenzo Galdi, University of Sannio, Italy
Lukas Gallmann, ETH Zurich, Switzerland
Thomas Gerrits, National Institute of Standards & Technology, USA
Reuven Gordon, University of Victoria, Canada
Frédéric Grillot, Télécom ParisTech, France
Charlotte Hagen, University College London, UK
Amr Helmy, Univ. of Toronto, Canada
Javier Hernandez-Andres, University of Granada, Spain
Anthony Hoffman, University of Notre Dame, USA
Ryoichi Horisaki, Osaka University, Japan
Weisheng Hu, Shanghai Jiao Tong University, China
Yue-Kai Huang, NEC Laboratories America, Inc., USA
Olindo Isabella, Delft University of Technology, The Netherlands
Ravi Jain, University of New Mexico, USA
Ebrahim Karimi, University of Ottawa, Canada
Mercedeh Khajavikhan, University of Central Florida, CREOL, USA
Hoon Kim, KAIST, South Korea
Christian Kränkel, University of Hamburg, Germany
Fredrik Laurell, KTH, Sweden
Changhui Li, Peking University, China
Jensen Li, Hong Kong University of Science and Technology, Hong Kong
Fan Li, Sun Yat-Sen University, China
Mo Li, University of Washington, USA
Yan Li, Shanghai Jiao Tong University, China
Hsing-Chih Liang, National Taiwan Ocean University, Taiwan
Yi-Hsin Lin, National Chiao Tung University, Taiwan
Natalia Litchinitser, Duke University, USA
Shutian Liu, Harbin Institute of Technology, China
Penghui Ma, National Research Council Canada, Canada
Pasquale Maddaloni, Istituto Nazionale di Ottica-Consiglio Nazionale delle Ricerche (INO-CNR), Italy
Mangirdas Malinauskas, Vilnius University, Lithuania
Antonio Mecozzi, University of L'Aquila, Italy
Argishti Melikyan, Nokia—Bell Labs, USA
Rajesh Menon, University of Utah, USA
Paolo Minzioni, University of Pavia, Italy
Jeffrey Moses, Cornell University, USA
Stuart Murdoch, University of Auckland, New Zealand
Patrick P. Naulleau, Lawrence Berkeley National Laboratory, USA
Johan Nilsson, University of Southampton, UK
Boon Ooi, King Abdullah University of Science & Technology, Saudi Arabia
YongKeun (Paul) Park, KAIST, South Korea
Marco Peccianti, University of Sussex, UK
Nicholas Peters, Oak Ridge National Laboratory, USA
Joyce Poon, University of Toronto, Canada
Jie Qiao, Rochester Institute of Technology, USA
Fabien Quéré, CEA Iramis, France
Mahmoud Rasras, New York University Abu Dhabi, UAE
Ronald Reano, Ohio State University, USA
Gordon Robb, University of Strathclyde, UK
Fabian Rotermund, KAIST, South Korea
Sukesh Roy, Spectral Energies LLC, USA
Jose Sanchez-Gil, Instituto de Estructura de la Materia, Spain
Clara Saraceno, Ruhr University Bochum, Germany
Giuliano Scarcelli, University of Maryland, College Park, USA
Paolo Serena, University of Parma, Italy
Tero Setala, University of Eastern Finland, Finland
David Shealy, University of Alabama, Birmingham, USA
Yoav Shechtman, Technion, Israel Institute of Technology, Israel
Jin-Wei Shi, National Central University, Taiwan
Kehar Singh, The NorthCap University Gurgaon, India
David Spence, Macquarie University, Australia
Balaji Srinivasan, Indian Institute of Technology, Madras, India
Isabelle Staude, University of Jena, Germany
Jim Sullivan, Florida Atlantic University, Harbor Branch Oceanographic Institute, USA
Xiankai Sun, Chinese University of Hong Kong, Hong Kong
V R Supradeepa, Indian Institute of Science, India
Simon Thibault, University of Laval, Canada
Victor Torres-Company, Chalmers University of Technology, Sweden
Dmitry Turchinovich, Bielefeld University, Germany
Qiong-Hua Wang, Sichuan University, China
Gordon Wetzstein, Stanford University, USA
Michael Withford, Macquarie University, Australia
Ulrich Wittrock, Münster University of Applied Sciences, Germany
Kenneth Kin-Yip Wong, University of Hong Kong, Hong Kong
Gerard Wysocki, Princeton University, USA
Qihua Xiong, Nanyang Technical University, Singapore
Xianfan Xu, Purdue University, USA
Vladislav Yakovlev, Max Planck Institute of Quantum Optics, Germany
Shinji Yamashita, University of Tokyo, Japan
Ho-Soon Yang, Korea Research Institute of Standards and Science, South Korea
Joel Yang, Singapore University of Technology and Design, Singapore
Xiaodong Yang, Missouri University of Science and Technology, USA
Chang-Jae Yu, Hangyang University, South Korea
Zeev Zalevsky, Bar-Ilan University, Israel
Michalis Zervas, University of Southampton, UK
Pengwang Zhai, University of Maryland Baltimore County, USA
Ning Hua Zhu, Institute of Semiconductors, Chinese Academy of Sciences, China
Zuqing Zhu, University of Science and Technology of China, China
Qunbi Zhuge, Ciena Corp., Canada

Staff

Editorial and Production E-mail Phone
Carmelita Washington, Peer Review Manager opex@osa.org 202-416-1921
Feature proposals dmcdonold@osa.org
Sharon Jeffress, Director, Electronic Publishing sjeffr@osa.org 202-416-1448
Sara Naughton, Managing Editor 202-416-1920
Oedipa Rice, Electronic Production Editor
Lynne Sturtz, Electronic Production Editor 202-416-1922
Article processing charges billing@osa.org

General Information
Copyright Permission Requests copyright@osa.org
Online journal technical support elec@osa.org
Elizabeth Nolan, Chief Publishing Officer
Kelly Cohen, Senior Publisher
M. Scott Dineen, Senior Director, Publishing, Production & Technology
Jennifer Mayfield, Deputy Senior Director, Electronic Publications
Christopher Videll, Deputy Senior Director, Production & Technology
Tim Fincham, Director, Production & Technology
Dan McDonold, Editorial Director
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