Abstract

Approximate closed-form expressions are developed for predicting the substrate absorption, volume absorption, and interface absorption at oblique angles of incidence for quarter-wave stack reflectors. At normal incidence the results for S- and P-polarized radiation reduce to those obtained by Sparks [ M. Sparks, J. Opt. Soc. Am. 67, 1590 ( 1977)] and Bennett and Burge [ H. E. Bennett and D. K. Burge, J. Opt. Soc. Am. 70, 268 ( 1980)]. The significant difference in the interface absorption for S- and P-polarized light at large angles of incidence is of interest in damage threshold theory, especially damage due to surface defects or contamination. Simple expressions are also derived for the S- and P-polarization phase shift caused by layer-thickness errors or operation at non-quarter-wave wavelengths. A difference in the S and P phase shifts is of importance in annular resonator design and in assessing the uncorrectable beam degradation due to uneven mirror heating. Exact computer results based on the matrix methods are compared with the predictions of the simple expressions, and agreement to well within 1% is found in most cases of interest.

© 1983 Optical Society of America

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