Abstract

Two different methods for calculating the changes of polarization of light reflected from the surface of a biaxial material are compared. The principal values of the refractive index and the orientations of the principal dielectric axes, relative to a coordinate system defined by the plane of incidence and the plane of the surface, are assumed to be known. By use of either method of calculation, the reflection properties can be summarized in terms of a reflection matrix suitable for use in the Jones calculus. This permits calculation of the null settings of the polarizer and analyzer in a conventional ellipsometer. These calculations apply to a biaxial surface measured with an ellipsometer.

© 1975 Optical Society of America

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