Abstract

Ellipsometric measurements of the refractive index and absorption coefficient of vacuum-evaporated perylene films are reported for the wavelength range 0.35 μm ≤ λ ≤ 0.7 μm. An independent determination of refractive index at one wavelength by a critical-angle measurement allows calculation of both optical constants as well as the film thickness from the ellipsometer data. The principal features of the wavelength dependence of the film absorption are a broad maximum around 0.5 μm, a weak peak from 0.41 − 0.45 μm, and a strong edge at 0.375 μm. Each of these features corresponds to a peak in the crystal absorption spectrum measured by Hochstrasser.

© 1973 Optical Society of America

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