Abstract

Strain-induced changes in the optical (dielectric) constants of silver films on lead zirconate titanate are determined ellipsometrically. In general, for a contaminant-free surface, the induced changes can be determined directly from the ellipsometer measurements. An additional advantage of the method is that it allows compensation for errors introduced by unavoidable mechanical vibrations. In the development of the theory, four-zone expressions are derived for the general case that includes the effect of extraneous signals caused by mechanical vibration.

© 1971 Optical Society of America

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