Abstract

A description is given of a computer program for analyzing reflectance data from an absorbing medium in terms of the complex refractive index. The procedure is an adaptation of Tousey’s graphical method of locating the intersection of two or more curves of constant reflectance in the nk plane. It is also an extension of that method, in that it can be applied to thin films as well as to bulk specimens. In the case of films, information additional to the reflectance data must be used to choose from among multiple intersections of the isoreflectance curves. A method for plotting the isoreflectors is suggested.

© 1965 Optical Society of America

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