Abstract

A comparator with a photoelectric detection system is described. Experimental data are reported to demonstrate that the same setting precision of ±0.2 micron is associated with the measured position of a normally exposed two-beam interference fringe, an overexposed two-beam interference fringe, a multiple-beam interference fringe, and a spectral line. The corresponding setting precisions obtained by the usual visual techniques are ±6.2, ±3.0, ±1.1, and ±0.6 microns, respectively.

© 1959 Optical Society of America

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