Abstract

Measurements have been made by multiple beam interference methods using Fizeau fringes and fringes of equal chromatic order to obtain the variation of phase change on reflection as a function of film thickness for chromium films deposited by evaporation on glass substrates. The results do not agree closely with theoretical curves but this has been shown to be due to the inhomogeneity of the chromium films and the deviations from theory have been explained in terms of a structural model based on independent evidence. The experimental curve has been used to explain anomalies which have been reported previously in measurements of the thickness of silver films by multiple beam interference methods when chromium is used as the reflecting overlayer.

© 1959 Optical Society of America

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