Abstract

Infrared spectra of synthetic, semicrystalline aluminosilicates in the region 500-1200 cm<sup>-1</sup> show a dominant band due to Si-O stretching at 980-1030 cm<sup>-1</sup> and two combined bands due to Si-O-Al bending at 600-700 cm<sup>-1</sup>. These bands can be used to determine quantitatively the Si/Al ratio of the aluminosilicates. A calibration curve has been obtained by integrating the intensities of the bands and relating them to Si/Al ratios of 10 aluminosilicate samples as measured with inductively coupled plasma (ICP) with Si/Al ratios ranging from 0.19 to 1.46.

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