We present a spectroscopic technique that is a hybrid between reflection-absorption and attenuated total reflection (ATR) spectroscopy. The method, which we call attenuated internal reflection (AIR), is suitable for the investigation of thin film liquids on non- or weakly absorbing substrates. In AIR the interrogating infrared beam is not exposed to vapor that may be associated with the film, but unlike ATR there are few geometric constraints on the substrate. We show the theoretical basis for the method and results from experiments demonstrating its use.

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