We have examined the effect of intensity-axis correction on noise in white light spectra recorded with charge-coupled device (CCD) detectors. Measurements were made with five detectors in Raman spectrometers. Detectors were both liquid-nitrogen and thermoelectrically cooled devices and one room temperature device. Both random and pattern noise have been considered. We used cross-correlation of noise sets to provide an indicator of a fixed pattern in the spectra and an assessment of the efficacy of the correction procedure in removing this pattern. For four of the five detectors intensity-axis correction provided a significant improvement in signal-to-noise ratio. Correction was particularly important for measurements made with lower-cost CCD detectors of the kind proposed for process control instruments.
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