Abstract

The amorphous structure of MoS2 films prepared by pulsed laser deposition (PLD) has been evaluated with the use of Raman and X-ray photoelectron spectroscopy (XPS). The initial study of the room-temperature deposited films indicated a featureless Raman spectrum. On closer examination, however, four weak reproducible bands were observed. There has been some confusion in the literature as to the nature of this spectrum-whether it represents an amorphous MoS3 structure or a mixture of MoS2 and sulfur. Our interpretation of the Raman and XPS data indicates that the laser-deposited films represent a mixture of small domains of MoS2 and amorphous sulfur.

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