Regular polygonal reactive internal reflection elements (IREs) have been designed and fabricated for Fourier transform infrared (FTIR) internal reflection spectroscopy (IRS) to study adsorption phenomena at the IRE surface. The geometric and optical features of these polygonal IREs are described with respect to the use of the FT-IR/IRS adsorption density equation. An octagonal internal reflection element of fluorite (CaF2) was prepared with 3 mm sides, and adsorption at the polygon faces was examined by FT-IR/IRS. Adsorption densities thus determined at the surface of the polygonal IRE were found to compare well with those determined at the surface of the parallelepiped IREs of the same material. The utility of regular polygonal IREs, including the advantages and disadvantages, is discussed.

PDF Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription