Abstract

An electrodeposition preconcentration technique was used in conjunction with total reflection x-ray fluorescence (TRXRF) analysis. Fnhancement in sensitivity on the order of 10<sup>3</sup> was realized for the ions investigated here. In addition, x-ray scattering was reduced and a degree of selectivity was achieved by the electrodeposition. The results suggest that trace elemental analysis (sub-ppb level) with chemical speciation capability is feasible by using TRXRF with a conventional x-ray source.

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