Adhesion mechanisms can be studied through observation of changes in the frequency of infrared absorption bands of molecules near a metal surface when compared with the corresponding bands of bulk of the material. However, measurement of the extremely weak bands afforded by molecular layers less than 20 Å thick using conventional reflection-absorption (R-A) techniques is quite difficult even using Fourier transform infrared (FT-IR) spectrometers at their maximum allowed optical throughput, since mercury cadmium telluride detectors cannot be used without the measurement being digitization noise limited. Even when parallel-polarized radiation at incident angles greater than 80° is used, as suggested by Greenler, the surface reflectance is still high enough to cause the signal/noise ratio (SNR) of the interferogram to be limited by the dynamic range of the analog-to-digital converter and the linearity of the detector.

PDF Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription