Abstract

The necessity to employ two-dimensional statistical methods in emission spectroscopy and the dependence of variance of ΔY, i.e. of the logarithm of the intensity ratio of an analysis-internal standard line pair, on correlation and regression are pointed out. To investigate the statistical behaviour of intensity ratios or the correlation of other quantities the scatter diagram method and its improvement by the contour ellipse are described. Examples of various applications are given and the calculation of the <i>"Complete Statistical Analysis"</i> is described. Finally the completion of the scatter diagram method by statistical test methods is illustrated by examples.

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