Abstract

In a previous work, we introduced the concept of transversal aberrations {U,V} calculated at arbitrary Hartmann-plane distances z=r [Appl. Opt. 55, 2160 (2016) [CrossRef]  ]. These transversal aberrations can be used to estimate the wave aberration function W, as well as the classical transversal aberrations {X,Y} calculated at a theoretical plane z=f, where f is the radius of a reference semisphere. However, when the ray identification is difficult to achieve at z=f, the use of {U,V} can be of great help. In the context of a least-squares fitting of the Hartmann data, the use of {U,V} is proposed by analyzing some simple examples for the case of a W with aberration terms up to the third order. These examples also consider the hypothesis fW, as presented in the majority of the optical applications.

© 2017 Optical Society of America

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