Abstract
The stress and microstructure of reactively sputtered Ni/Ti multilayers with different bilayer is investigated for applications in neutron optical devices. The microstructure of multilayers has been characterized by GIXR, XRD and XPS measurements.
© 2019 The Author(s)
More Like This
Xiang Lu, Tai D. Nguyen, Regina Soufli, Eric M. Gullikson, and James H. Underwood
TuC.7 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994
Andreas Frigg, Andreas Boes, Guanghui Ren, Duk-Yong Choi, Silvio Gees, and Arnan Mitchell
ce_p_38 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2019
Chuen-Lin Tien, Po-Chih Chen, Kuei-Luen Chen, Chien-Jen Tang, Sheng-Hua Lu, and Shih-Chin Lin
ThD.12 Optical Interference Coatings (OIC) 2016