Abstract

Indium Gallium Arsenide (InGaAs) photodetectors have been fabricated which exhibit dark current as low as 10 picoamps (−5V), quantum efficiencies as high as 35% at 850nm, 90% at 1300nm, 93% at 1550nm and failure rates below 1 in 109 hours (1 Failure unIT = 1 FIT). The devices have 75 micron diameter active regions with InP "cap" layers. Pulse response times below 35 picoseconds have also been measured.

© 1987 Optical Society of America

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription