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Raman microprobe analysis of dopant concentration profile in preforms and fibers

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Abstract

The presence of small amounts of impurities in silica gives rise to substantial changes in the Raman spectrum of pure (vitreous) v-SiO2. These can be analyzed with regard to frequency and intensity features, and one can obtain information about the mechanisms of incorporation of the dopants into silica (Ref. 1 and references therein) as well as their local concentration.2,3

© 1983 Optical Society of America

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