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  • International Photonics and OptoElectronics Meeting 2019 (OFDA, OEDI, ISST, PE, LST, TSA)
  • OSA Technical Digest (Optica Publishing Group, 2019),
  • paper OW3C.4
  • https://doi.org/10.1364/OEDI.2019.OW3C.4

High-resolution and Self-calibration Microwave Characterization of High-speed Optoelectronic Devices

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Abstract

In this talk, we will present heterodyne spectrum mapping for self-calibrated frequency response measurements of high-speed semiconductor laser diodes, Mach-Zehnder modulators, phase modulators and photodetectors with a shared self-heterodyne interferometer.

© 2019 The Author(s)

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