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  • OSA Advanced Photonics Congress (AP) 2019 (IPR, Networks, NOMA, SPPCom, PVLED)
  • OSA Technical Digest (Optica Publishing Group, 2019),
  • paper JT4A.9

Near-field Scanning Optical Microscopy of Luminescent Nanostructured Semiconductors

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Abstract

The ability to image nanostructures with far-field visible light optics is lim-ited by diffraction. We use Near-field Scanning Optical Microscopy (NSOM/SNOM) to increase resolution of luminescence imaging, while avoiding radiation damage.

© 2019 The Author(s)

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Poster Presentation

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