Abstract
We investigated localized surface plasmon (LSP) enhanced imaging to improve total internal reflection microscopy. The evanescent field enhancement is based on plasmon excitation localized by subwavelength patterns such as gratings and islands. An optimum sample was calculated and fabricated as silver grating and islands on a silver film and a glass substrate. Field intensity improvement of an LSP-enhanced sample was confirmed relative to that on a bare prism and a thin film/prism as controls.
© 2009 Optical Society of America
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