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  • Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper FWN3
  • https://doi.org/10.1364/FIO.2008.FWN3

Focused X-ray Beam Characterization by Phase Retrieval with a Moveable Phase-shifting Structure

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Abstract

Characterization of focused x-ray beams by phase retrieval is addressed. We introduce diversity to the phase retrieval problem in a practical way by translating a phase-shifting structure relative to the beam, allowing for superior reconstructions.

© 2008 Optical Society of America

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