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  • Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper FThL5
  • https://doi.org/10.1364/FIO.2008.FThL5

Characterization of Scattering From Nanoparticles Using Far-Field Interferometric Microscopy

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Abstract

Analysis and simulations show that coherent confocal microscopy techniques, such as Optical Coherence Microscopy, can be used to estimate the polarizability tensor of an imaged nanoparticle. The estimation process is robust to noise and defocus.

© 2008 Optical Society of America

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