Abstract
We introduce a polarimetry-based far-field method for the study of the interaction between a three-dimensional focused field and a sub-resolution scatterer in the focal region of a high numerical aperture lens. We show that it is possible to analyze this interaction by measuring the spatially-resolved polarization state of the scattered light across the exit pupil of the detection system. This method may be used to analyze objects with sub-resolution features.
© 2008 Optical Society of America
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