Elastic backscattering spectroscopic microscopy

Yang Liu; Xu Li; Young L. Kim; Vadim Backman

doi:10.1364/FIO.2005.FTuN1

Frontiers in Optics
OSA Technical Digest Series (Optica Publishing Group, 2005),
paper FTuN1
•https://doi.org/10.1364/FIO.2005.FTuN1

Elastic backscattering spectroscopic microscopy

Yang Liu, Xu Li, Young L. Kim, and Vadim Backman

Frontiers in Optics 2005

Tucson, Arizona United States
16–21 October 2005
ISBN: 1-55752-797-0

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Scattering and Diffuse Optics (FTuN)

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Y. Liu, X. Li, Y. L. Kim, and V. Backman, "Elastic backscattering spectroscopic microscopy," in Frontiers in Optics, OSA Technical Digest Series (Optica Publishing Group, 2005), paper FTuN1.

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Abstract

We present elastic backscattering spectroscopic microscopy that allows simultaneous acquisition of sub-micron-resolution images and backscattering spectra at each pixel. It enables detection of highly localized scattering features within a single micro-particle and densely packed scatterers.

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