Time-resolved carrier dynamics in ZnO epilayers and nanorods

X. Wang; YD Jho; X. Wei; Y.-W. Heo; J.-M. Erie; D. P. Norton; D. H. Reitze

doi:10.1364/FIO.2005.FTuF5

Frontiers in Optics
OSA Technical Digest Series (Optica Publishing Group, 2005),
paper FTuF5
•https://doi.org/10.1364/FIO.2005.FTuF5

Time-resolved carrier dynamics in ZnO epilayers and nanorods

X. Wang, YD Jho, X. Wei, Y.-W. Heo, J.-M. Erie, D. P. Norton, and D. H. Reitze

Frontiers in Optics 2005

Tucson, Arizona United States
16–21 October 2005
ISBN: 1-55752-797-0

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Time-Resolved Spectroscopy of Novel Materials (FTuF)

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X. Wang, Y. Jho, X. Wei, Y. -. Heo, J. -. Erie, D. P. Norton, and D. H. Reitze, "Time-resolved carrier dynamics in ZnO epilayers and nanorods," in Frontiers in Optics, OSA Technical Digest Series (Optica Publishing Group, 2005), paper FTuF5.

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Abstract

We have measured the time-resolved differential reflectivity (TRDR) signal of ZnO epilayers and nanorods as a function of temperature and excitation wavelength. Non-exponential decays are observed, and relaxation times depend strongly on excitation wavelength.

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