Dielectric Tensors Via Non-scanning Variable Angle Ellipsometry

Neil A. Beaudry; Yanming Zhao; Philip McCulloch; Russell Chipman

doi:10.1364/FIO.2005.FMB3

Frontiers in Optics
OSA Technical Digest Series (Optica Publishing Group, 2005),
paper FMB3
•https://doi.org/10.1364/FIO.2005.FMB3

Dielectric Tensors Via Non-scanning Variable Angle Ellipsometry

Neil A. Beaudry, Yanming Zhao, Philip McCulloch, and Russell Chipman

Frontiers in Optics 2005

Tucson, Arizona United States
16–21 October 2005
ISBN: 1-55752-797-0

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Polarization Optics and Systems I (FMB)

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N. A. Beaudry, Y. Zhao, P. McCulloch, and R. Chipman, "Dielectric Tensors Via Non-scanning Variable Angle Ellipsometry," in Frontiers in Optics, OSA Technical Digest Series (Optica Publishing Group, 2005), paper FMB3.

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Abstract

A non-scanning technique for measuring ellipsometric parameters as a function incident and azimuthal angles is presented. This technique is especially suited to measuring the dielectric tensor of arbitrarily oriented biaxial materials.

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