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  • Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
  • OSA Technical Digest Series (Optica Publishing Group, 2004),
  • paper FThT4
  • https://doi.org/10.1364/FIO.2004.FThT4

Low-Level Birefringence Measurements Applied to Optical Interconnects

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Abstract

Birefringence arises in optical interconnects due to residual stress. This affects reliability and performance. A new full-field retardation measurement method is presented and compared to the existing Brace-Köhler technique. Both methods are applied to retrieve the twodimensional birefringence distribution of optical fibers and polymer waveguides.

© 2004 Optical Society of America

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