Calibration methods for Spatial Light Interference Microscopy

Z. TANG; K. O’DWYER; B.M. HENNELLY; B.M. HENNELLY

doi:10.1364/DH.2019.W1B.7

Digital Holography and Three-Dimensional Imaging 2019
OSA Technical Digest (Optica Publishing Group, 2019),
paper W1B.7
•https://doi.org/10.1364/DH.2019.W1B.7

Calibration methods for Spatial Light Interference Microscopy

Z. TANG, K. O’DWYER, and B.M. HENNELLY

Digital Holography and Three-Dimensional Imaging 2019

Bordeaux France
19–23 May 2019
ISBN: 978-1-943580-59-0

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Imaging III (W1B)

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Z. TANG, K. O’DWYER, and B. M. HENNELLY, "Calibration methods for Spatial Light Interference Microscopy," in Digital Holography and Three-Dimensional Imaging 2019, OSA Technical Digest (Optica Publishing Group, 2019), paper W1B.7.

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Abstract

The Spatial Light Interference Microscopy technique uses four annular phase shifting patterns sequentially displayed on a spatial light modulator. The steps involved in accurately determining the optimal values of these four phase patterns are discussed.

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