Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > DH > 2019 > Tu4B > Tu4B.7

High-Resolution Single-Shot Surface Shape and in-situ Measurements using Quadriwave Lateral Shearing Interferometry

Sherazade Aknoun, Antoine Federici, Anaïs Saintoyant, William Boucher, and Benoit Wattellier

Not Accessible

Your library or personal account may give you access

Abstract

In this paper, we present a high-sensitive single-arm interferometry technology, called quadriwave lateral shearing interferometry, applied to surface shape and in-situ refractive index variation measurement. This full-field artefact-free technology enables single-shot measurement of the optical path difference (OPD) of samples over a large field of view along with an OPD resolution of 0.5nm.

© 2019 The Author(s)

PDF Article
More Like This
Quadriwave Lateral Shearing Interferometry applied to Multiwell Plates Imaging with dedicated Acquisition and Treatment Processing

Sherazade Aknoun, Anaïs Saintoyant, Fabrice Valentino, Antoine Federici, and Benoit Wattellier
M4B.8 Digital Holography and Three-Dimensional Imaging (DH) 2019

High-Definition Quantitative Phase Imaging System applied to live cell samples

Anaïs Saintoyant, Sherazade Aknoun, Fabrice Valentino, Antoine Federici, and Benoit Wattellier
Th4A.6 Digital Holography and Three-Dimensional Imaging (DH) 2019

ISO compliant M2 measurement using a quadriwave lateral shearing interferometer wave front sensor

Ivan Doudet, Vincent Prévost, and Benoit Wattellier
JTh2A.68 CLEO: QELS_Fundamental Science (CLEO:FS) 2013

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use