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Conferences > CLEO_SI > 2019 > SF2O > SF2O.3

Nanoscale inspection of GaN LED devices using g(2) cathodoluminescence imaging

Toon Coenen, Sophie Meuret, Y. H. Ra, Z. Mi, and Albert Polman

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Abstract

We apply a combination of hyperspectral cathodoluminescence and g(2) imaging to bulk and nanostructured LED materials. From these measurements we extract both excited state lifetimes and the probability of excitation of a single primary electron.

© 2019 The Author(s)

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