Abstract
Using the optical beam deflection method we measure the transient optical nonlinearity of titanium nitride thin films deposited at 350° and 800° C around their respective epsilon near-zero wavelengths.
© 2018 The Author(s)
PDF ArticleMore Like This
Jennifer M. Reed, Manuel R. Ferdinandus, Nathaniel Kinsey, Clayton DeVault, Urcan Guler, Vladimir M. Shalaev, Alexandra Boltasseva, and Augustine Urbas
FTu1A.6 CLEO: QELS_Fundamental Science (CLEO:FS) 2016
Sepehr Benis, Peng Zhao, Himansu S. Pattanaik, David J. Hagan, and Eric W. Van Stryland
FM2F.2 CLEO: QELS_Fundamental Science (CLEO:FS) 2017
Sepehr Benis, David J. Hagan, and Eric W. Van Stryland
FF2E.1 CLEO: QELS_Fundamental Science (CLEO:FS) 2018