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Four-wave mixing microscopy of resonant silicon-on-insulator two-dimensional zero contrast gratings

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Abstract

Four-wave mixing microscopy of resonant, silicon-on-insulator, two-dimensional zero-contrast grating is reported for large incident input wavelength separation of ~540 nm. Four-wave mixing signal on-grating is enhanced by 352x when compared to off-grating at resonance.

© 2019 The Author(s)

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