Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Multifrequency Near Field Scanning Optical Microscopy (MF-SNOM)

Not Accessible

Your library or personal account may give you access

Abstract

We introduce a novel excitation and detection scheme in near-field optical microscopy based on a multifrequency method. Using this method, we experimentally demonstrate enhanced sensitivity, implying improved spatial resolution in optical measurements.

© 2018 The Author(s)

PDF Article
More Like This
Optical Multifrequency Scanning Probe Microscopy

D. C. Kohlgraf-Owens, L. Greusard, S. Sukhov, R. Colombelli, Y. De Wilde, and A. Dogariu
FW2F.3 Frontiers in Optics (FiO) 2012

High-speed Scanning Near-field Optical Microscopy

Takayuki Umakoshi, Shingo Fukuda, Takayuki Uchihashi, Prabhat Verma, and Toshio Ando
19a_211B_1 JSAP-OSA Joint Symposia (JSAP) 2018

Scanning near-field optical microscopy (SNOM) of lithium niobate aperiodically poled during growth

J. Lamela, E. Cautelar, J. A. Sauz-Garda, G. Lijante, F. Cussó, F. Jaque, J. Canet-Ferrer, and J. Martinez-Pastor
CE_16 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2007

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved