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Cryogenic Near-Field Imaging and Spectroscopy at the 10-Nanometer-Scale

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Abstract

We extend conventional near-field microscopy at ambient conditions to the cryogenic temperature range (<10-300Kelvin). We will present first nano-optical measurements on semiconductor samples and single-layer materials highlighting the novel insights attainable by our cryo-neaSNOM.

© 2018 The Author(s)

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