Abstract

The recent development of transient spectroscopy based on optoelectronically pulsed antennas has provided a new microwave measurement technique with broad frequency coverage. This technique has proved particularly useful in determining the frequency-dependent dielectric properties of low-loss materials in transmission experiments. For the characterization of conducting and semiconducting samples, where the presence of free carriers leads to strong absorption of the microwave radiation, a reflection configuration is preferred. Here we demonstrate transient spectroscopy experiments in reflection with broadband mierowave measurements on dielectrics and on semiconductors with a wide range of resistivities.

© 1991 Optical Society of America

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