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A diffraction based optical particle sizer capable of performing measurements (in the 1.3-126-µm range) in high temperature environments (up to 1200°C) has been developed. The principle of operation relies on the fact that light scattered by spherical particles (larger than the illuminating wavelength) can conveniently be described by the diffraction pattern generated by the particles boundary.1
© 1990 Optical Society of America
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