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Conferences > CLEO > 1986 > CPD > ThU10

Picosecond Photoemission Sampling Of High-Speed Circuits

A. M. Johnson, O. Bokor, W. M. Simpson, and R. H. Storz

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Abstract

We have developed a new contactless, noninvasive technique for the high-speed sampling of voltage waveforms on electronic devices. The method is based on the energy analysis of electrons ejected from the surface of a metallization line on the device into vacuum using an ultrashort laser pulse to stimulate the electron emission. By exploiting the multiphoton photoelectric effect, it is possible to use a visible wavelength laser.

© 1986 Optical Society of America

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