Abstract
Since optical perfection of laser crystal is very important to take a high-quality laser beam, a lot of characterization methods are usually used to observe defects in crystals. In these methods, x-ray topography, the optical microscope, and Twyman-Green interferometry are conventionally used to characterize the crystal defects and optical inhomogeneity in crystals. However, these methods each has its own weakness; that is, the topographic contrast of x ray depends on the thickness of crystalline specimens, and the specimen must also be sliced to get a good contrast, because x-ray beams cannot transmit through a thick specimen.
© 1986 Optical Society of America
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