Abstract
The accurate measurement of distance to a poorly reflecting surface is required in many industrial applications. These applications often involve a moving target having a wide variation in reflectivity. This paper describes a technique which uses a semiconductor laser system which electronically compensates for a wide dynamic range in the reflected signal and which is capable of rapid measurement in real time. The system is based on the fact that as the path length of a modulated laser beam is altered, there will be a corresponding phase shift in the received signal.
© 1985 Optical Society of America
PDF ArticleMore Like This
L. E RICHTER, H. I. MANDELBEBG, M. S. KRUGER, and P. A. MCGRATH
TUI3 Conference on Lasers and Electro-Optics (CLEO:S&I) 1985
Lori L. Jeromin, B. Reiffen, and V. W. S. Chan
MH5 Optical Fiber Communication Conference (OFC) 1985
J. BUDS
WB1 Conference on Lasers and Electro-Optics (CLEO:S&I) 1985