Mapping of defects on apical recording disks

V. Marrello; M. Chen; R. Weiss; W. Martin; U. Gerber

doi:10.1364/CLEO.1982.WH4

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1982),
paper WH4
•https://doi.org/10.1364/CLEO.1982.WH4

Mapping of defects on apical recording disks

V. Marrello, M. Chen, R. Weiss, W. Martin, and U. Gerber

Conference on Lasers and Electro-Optics 1982

Phoenix, Arizona United States
14–16 April 1982
ISBN:

From the session
Optical Storage: 1 (WH)

Open Access

Get PDF
Email
Share
Get Citation
Copy Citation Text
V. Marrello, M. Chen, R. Weiss, W. Martin, and U. Gerber, "Mapping of defects on apical recording disks," in Conference on Lasers and Electro-Optics, R. Abrams and A. Guenther, eds., OSA Technical Digest (Optica Publishing Group, 1982), paper WH4.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Bit error rate is an essential parameter for characterizing and controlling an optical data recording disk. An important factor which affects the bit error rate for an optical disk is the defect distribution of such a disk before recording.

PDF Article

More Like This

Error rate testing of optical data disks

Paul Shepherd, Miguel Capote, and Philip Scheinert
WH3 Conference on Lasers and Electro-Optics (CLEO:S&I) 1982

Principles of optical recording systems with AlGaAs lasers and pregrooved disks

Marino G. Carasso and Arie Huijser
WH1 Conference on Lasers and Electro-Optics (CLEO:S&I) 1982

Philips data systems semiconductor optical disk recorder

Maarten R. De Haan
WH2 Conference on Lasers and Electro-Optics (CLEO:S&I) 1982

Previous Article Next Article