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Conferences > CLEO > 1981 > THB > THB18

Submillimeter-wave Thomson-scattering ion temperature diagnostic using a pulsed D2O laser at 385 μm

P. Woskoboinikow, H. C. Praddaude, W. J. Mulligan, and D. R. Cohn

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Abstract

Unique technology has been developed and is now operational for the first time to measure plasma ion temperature by pulsed submillimeter-wave Thomson scattering. At the time of this writing actual plasma data were not available, but a single-shot simulated scattering measurement was made at the expected plasma-scattered signal levels. This test-scattering measurement has conclusively demonstrated the required equipment performance for a single-shot ion temperature measurement.

© 1981 Optical Society of America

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