An Enhanced Structured-Light Modulation System for Defect Detection of Specular Surface

Yiyang Huang; Huimin Yue; Yuyao Fang; Hongli Chen; Yong Liu

Asia Communications and Photonics Conference (ACPC) 2019
OSA Technical Digest (Optica Publishing Group, 2019),
paper M4A.315

An Enhanced Structured-Light Modulation System for Defect Detection of Specular Surface

Yiyang Huang, Huimin Yue, Yuyao Fang, Hongli Chen, and Yong Liu

Asia Communications and Photonics Conference 2019

Chengdu China
2–5 November 2019
ISBN: 978-1-943580-70-5

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Joint Poster Session (M4A)

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Y. Huang, H. Yue, Y. Fang, H. Chen, and Y. Liu, "An Enhanced Structured-Light Modulation System for Defect Detection of Specular Surface," in Asia Communications and Photonics Conference (ACPC) 2019, OSA Technical Digest (Optica Publishing Group, 2019), paper M4A.315.

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Abstract

The structured-light modulation analysis technique can be used to detect the defects on the specular surface. Based on this techinque, an enhanced modulation system is proposed in this paper, which gets better detection results.

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